Review

    Seeing the Invisible-Understanding Thermoelectric Materials through Scanning Transmission Electron Microscopy
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    • Yukun Liu
      Yukun Liu
      Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, United States
      International Institute of Nanotechnology (IIN), Northwestern University, Evanston, Illinois 60208, United States
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    • Patricia E. Meza
      Patricia E. Meza
      Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, United States
      International Institute of Nanotechnology (IIN), Northwestern University, Evanston, Illinois 60208, United States
    • Zhi Li
      Zhi Li
      Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, United States
      More by Zhi Li
    • Xiaobing Hu
      Xiaobing Hu
      Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, United States
      More by Xiaobing Hu
    • Roberto dos Reis
      Roberto dos Reis
      Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, United States
      International Institute of Nanotechnology (IIN), Northwestern University, Evanston, Illinois 60208, United States
    • Christopher Wolverton
      Christopher Wolverton
      Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, United States
      International Institute of Nanotechnology (IIN), Northwestern University, Evanston, Illinois 60208, United States
    • Vinayak Dravid*
      Vinayak Dravid
      Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, United States
      International Institute of Nanotechnology (IIN), Northwestern University, Evanston, Illinois 60208, United States
      Department of Chemistry, Northwestern University, Evanston, Illinois 60208, United States
      *Email: [email protected]
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    Chemistry of Materials

    Cite this: Chem. Mater. 2026, XXXX, XXX, XXX-XXX
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    https://doi.org/10.1021/acs.chemmater.5c02947
    Published April 9, 2026
    © 2026 The Authors. Published by American Chemical Society

    Abstract

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    Understanding the intricate relationship between the structure and transport properties is central to advancing thermoelectric materials. Scanning transmission electron microscopy (STEM) provides multiscale and multimodal characterization that enables direct correlation among the atomic structure, chemical composition, and functional behavior. Through its ability to probe defects, interfaces, and compositional complexity across multiple length scales, STEM has become an essential platform for revealing how local structural features influence charge and heat transport. This review summarizes recent progress in advanced STEM methodologies for thermoelectric research. Aberration-corrected STEM allows for direct imaging of atomic configurations and defect structures with high spatial precision. Four-dimensional STEM extends this capability to quantitative mapping of orientation, phase, and strain distributions, while differential phase contrast imaging provides access to potential variations and local electrostatic fields. Emerging techniques such as electron ptychography, atomic-resolution energy dispersive spectroscopy, vibrational electron energy loss spectroscopy, and data-driven analysis are also discussed for their potential to enhance spatial resolution and extract new physical insights. Collectively, these developments establish STEM as a powerful framework for understanding structure–property relationships and guiding the design of next-generation thermoelectric materials.

    © 2026 The Authors. Published by American Chemical Society

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    Chemistry of Materials

    Cite this: Chem. Mater. 2026, XXXX, XXX, XXX-XXX
    Click to copy citationCitation copied!
    https://doi.org/10.1021/acs.chemmater.5c02947
    Published April 9, 2026
    © 2026 The Authors. Published by American Chemical Society

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