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Scanning Probe Microscopy
Author(s):
- Laurene TetardAssociate ProfessorUniversity of Central FloridaEmail: [email protected]More by Laurene Tetard
Publication Date:
May 22, 2023
Copyright ©
2023 American Chemical Society
eISBN:
9780841299573
DOI:
10.1021/acsinfocus.7e7008
Read Time:
six to seven hours
Collection:
2
Publisher:
American Chemical Society
Techniques of nanoscale functional imaging and spectroscopy have blossomed since the invention of scanning probe microscopy (SPM) tools, starting with scanning tunneling microscopy in the early 1980s. The ability to resolve topographical features with nanoscale—sometimes atomic—precision has revolutionized our understanding of molecules, matter, and living systems. These observations have led scientists to pose increasingly more complex questions about properties beyond morphology and their evolution upon external stimuli. Overall, SPM-based schemes provide versatile ways to probe structural, electrical, mechanical, and chemical properties of materials at the nanoscale.
Getting started with SPM can be intimidating. This digital primer aims to provide undergraduate and graduate students majoring in various fields of science and engineering with a practical guide to grasp essential concepts and principles related to SPM image and spectra formation and their interpretation. This guide may also be helpful to researchers who are considering new ways of evaluating nanoscale properties of materials, devices, or living systems as applicable to their respective fields. Because of the extensive literature on the developments and applications of SPM, it was impossible to comprehensively cover all aspects of the field. Hence, deliberate choices were made to emphasize some techniques that have not been discussed as extensively in the literature but hold great promise to understand complex systems at the nanoscale.
This book is coming soon. In the meantime, please contact your library or ACS sales representative for purchase options.
Detailed Table of Contents
About the Series
Preface
Chapter 1
Review of Basic Principles
1.1.
General Overview of Nanoscale Imaging Methods with SPM
1.2
Review of Forces and Their Role in SPM Imaging
1.2.1
Intermolecular and Intramolecular Forces
1.2.2
Different Types of Forces at Play in SPM
1.2.3
Lennard-Jones Potential
1.3
Resolution and Sensitivity
1.3.1
Spatial Resolution
1.3.2
Temporal Resolution
1.3.3
Spectral Resolution
1.3.4
Sensitivity
1.4
Oscillators
1.4.1
Oscillation, Resonance Frequency, and Q Factor
1.4.2
Measuring an Oscillation for SPM Imaging
1.5
Thermal Noise and Thermal Drift in SPM
1.5.1
Thermal Noise
1.5.2
Thermal Drift
1.6
Types of Excitations Used in SPM Measurements
1.6.1
Electron Tunneling and Tunneling Current
1.6.2
Electrical Signals
1.6.3
Light
1.6.4
Acoustic Waves
1.7
That’s a Wrap
1.8
Read These Next
Chapter 2
SPM Imaging and Probes
2.1
Exploration of Materials and Complex Systems at the Nanoscale
2.1.1
Features and Phenomena at the Nanoscale
2.1.2
Comparison of Different Probing Mechanisms to Image at the Nanoscale
2.2
Components of Scanning Probe Microscopy
2.2.1
SPM Tips and Their Design and Selection
2.2.2
Detectors
2.2.3
Raster-Scanning for SPM Imaging
2.2.4
Feedback Loops to Control Tip–Sample Interactions in SPM
2.2.5
Data Acquisition
2.3
That’s a Wrap
2.4
Read These Next
Chapter 3
SPM Experimental Techniques to Evaluate the Morphology of Specimens
3.1
Scanning Tunneling Microscopy (STM)
3.2
Atomic Force Microscopy (AFM)
3.2.1
AFM Force–Distance Curves
3.2.2
Contact Mode AFM
3.2.3
Tapping Mode AFM
3.2.4
Noncontact AFM
3.2.5
AFM Intermittent Force Mode or Peak Force Mode
3.2.6
Comparison of the Four AFM Modes
3.3
Near-Field Scanning Optical Microscopy (NSOM)
3.4
Working with SPM
3.4.1
General Considerations in Preparation for SPM Imaging
3.4.2
Mounting Probes and Controlling Environmental Conditions
3.4.3
Data Processing
3.4.4
Data Interpretation
3.5
Characterization of Complex Morphologies
3.6
That’s a Wrap
3.7
Read These Next
Chapter 4
Experimental Techniques for Functional Imaging
4.1
Nanomechanical Measurements
4.1.1
Force–Distance Curves and Nanomechanical Mapping Using Bare Tips
4.1.2
Tip Functionalization and Force Measurements
4.1.3
Multifrequency Imaging for Nanomechanical Mapping
4.2
Interfacial Measurements
4.3
Electrical Measurements
4.3.1
Measuring Local Density of State with STM
4.3.2
Measuring Conductivity and Photoconductivity with AFM
4.3.3
Measuring Surface Work Function, Surface Potential, and Charge Injection with AFM
4.3.4
Measuring Capacitance in Semiconductors with AFM
4.3.5
Measuring Piezoelectricity in Materials with AFM
4.4
Measuring Magnetic Properties with AFM
4.5
Nanoscale Infrared Spectroscopy and Imaging
4.5.1
Mid-Infrared Spectroscopy at the Nanoscale
4.5.2
Raman Spectroscopy at the Nanoscale
4.5.3
Considerations on Sample Preparation for Nanoscale Infrared Measurements
4.5.4
Data Acquisition and Analysis for Nanoscale Infrared Measurements
4.6
Electrochemistry Measurements
4.6.1
Electrochemical Measurements by Scanning Electrochemical Microscopy (SECM)
4.6.2
Electrochemical Measurements by Probing Ion Conductance
4.7
Expanding Nanoscale Functional Imaging
4.8
Insider Q&A Nina Balke
4.9
That’s a Wrap
4.10
Read These Next
Chapter 5
Applications of Imaging
5.1
Imaging Methods to Advance Our Fundamental Understanding of Chemistry
5.1.1
Visualizing Individual Molecules
5.1.2
Investigating Catalysts and Their Activity at the Nanoscale
5.2
Imaging Methods to Advance Our Fundamental Understanding of Biological Systems
5.2.1
Assaying Proteins and Biomolecular Processes
5.2.2
Imaging Cells and Subcellular Entities
5.2.3
Investigating Bacteria at the Nanoscale
5.2.4
Investigating the Local Properties of Tissues
5.3
Imaging Methods to Advance the Fundamental Understanding of Condensed Matter and Materials Engineering
5.4
Imaging Methods in Industrial Applications
5.4.1
Semiconductor Industry
5.4.2
Thin Film Coating in Industrial Applications
5.4.3
Polymer Material Industry
5.4.4
Pharmaceutical, Cosmetics, and Skin-Care Industry
5.4.5
Agrochemical Industry
5.4.6
Petroleum, Automotive, and Other Industries
5.5
Insider Q&A: Ricardo Garcia
5.6
Insider Q&A: Jason Killgore
5.7
Insider Q&A: Jeremy Beebe
5.8
That’s a Wrap
5.9
Read These Next
Chapter 6
Emerging techniques for imaging
6.1
Time-Resolved Functional Imaging
6.1.1
Video-Rate Nanoscale Imaging
6.1.2
Temporal Resolution from Micro- to Picosecond Scale
6.1.3
Temporal Resolution Beyond the Picosecond Scale
6.2
Nanoscale Subsurface Imaging
6.2.1
Force-Modulated AFM to Probe Subsurface Information at the Nanoscale
6.2.2
Acoustic-Based AFM to Probe Subsurface Information at the Nanoscale
6.2.3
Combining Light and SPM Measurements to Probe Subsurface Information at the Nanoscale
6.3
Further Advances in Nanoscale Functional Imaging
6.3.1
Measuring Temperature and Thermal Properties at the Nanoscale
6.3.2
Measuring pH at the Nanoscale
6.3.3
Discriminating Surface from Volume Information with SPM
6.4
Probing with Quantum-Based Sensors
6.5
Perspectives
6.5.1
Advancing Tools for Nanoscale Functional Imaging
6.5.2
Need for Deep Learning from the Rich Data
6.5.3
Need for Modeling
6.6
Insider Q&A: Liam Collins
6.7
That’s a Wrap
6.8
Read These Next
Bibliography
Index
Reviewer quotes
I would definitely use and recommend this primer after its publication. I have recently started to use scanning electrochemical microscopy in my research. Reviewing this primer has inspired me to apply the other discussed outstanding scanning probe methods in future projects.
Laurene Tetard is an Associate Professor in the Department of Physics and the NanoScience Technology Center at the University of Central Florida. She received her B.S. in Physics and Chemistry in 2004 and her M.S. in Physics – Nanotechnology in 2006 from the University of Burgundy in France. She received her Ph.D. in Physics from the University of Tennessee Knoxville in 2010. She was a Eugene P. Wigner Fellow at the Oak Ridge National Laboratory from 2011 to 2013 before joining the University of Central Florida as an Assistant Professor in 2013. Her interdisciplinary research has been distinguished by a NSF CAREER award, a Scialog award, a Gordon and Betty Moore Experimental Physics Investigator award, among others.
